ATE Component Testing - Switching Matrix
Advanced Temperature testing for Transistors, Resistors, Capacitors, Inductors, Thermistors, Diodes, or any other 2, 3, or 4 -leaded devices.

Features
Automated testing of components
Test up to 80 3, 4 leaded devices
Test up to 160 axial devices
-180 to +315 Deg C temperature range
Rapid Cycling up to 60 Deg C / min
PID Control
Local or Remote
Battery-Backed memory for programs and configuration
Controlled Ramping
Custom Fixtures available
Matrix door available on EC10 and EC11 models only


Sun Electronic System's EC10 and EC11 environmental chambers have the option of being equipped with a matrix door.The switching matrix provides automatic selection and measurement of multiple devices or components during temperature testing. It enhances productivity while providing precise accuracy and superior control. The switching matrix provides reliable temperature testing for high volume testing of components over a wide range of temperature (-180 to +315 Deg C). DUT are subjected either heated or cooled air circulating through the interior of the chamber.

A Kelvin measurement path is provided to the DUT using a 9-pin user port provided on the matrix door. This port can be used along with several different types of measurement devices specific to your application. DUT may be selected automatically or individually by referring to the specific device number which is labeled for each socket on the device board. Each device lead is provided with two electrically isolated traces and a Kelvin socket connection. Component board and the socket selection can be customized for the users specific application.

For a completely automated test system, the environmental chamber is equipped with IEEE-488, RS232/RS422 interfaces to control and monitor the chamber temperature. Programing the controller to automatically perform multiple segments and component selection for measurement is simplified by a BASIC-like command set consisting of integer variables, nested FOR/NEXT loops, GOSUB subroutine calls and I/O ports. Program debugging is aided by editing and debugging capabilities and programs can be uploaded or downloaded to or from a host computer. UP to 10 programs can be stored in battery-backed RAM and can be called as subroutines from other programs if required. For detailed specifications of the controller and the chambers sections, refer to the Environmental Chamber specifications.

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